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Aluminum Nitride Substrate

Functional Ceramic

Basic Information

Category: Functional Ceramic
Material Type: compound
Alternative Names:
AlNAluminum NitrideAlN CeramicAlN Substrate
Tags:
ceramichigh-thermal-conductivitysubstrateelectronicnon-oxide

Composition & Structure

Composition: AlN (>95% purity typical; sintering aids include Y₂O₃, CaO)
Microstructure: Dense polycrystalline wurtzite structure with equiaxed grains; grain boundary phase (typically yttrium aluminate) controls thermal conductivity; minimal porosity in high-quality substrates

Description

Aluminum nitride is a non-oxide ceramic with exceptional thermal conductivity (170-230 W/mK), used as a substrate for power electronics and LEDs. Reacts with water; non-aqueous preparation methods are preferred. Grain boundary phase analysis is critical for thermal conductivity optimization.

Mechanical Properties

Hardness: 1100-1200 HV
Hardness (HV): 1150 HV
Hardness Category: very-hard
Tensile Strength: 300 MPa

Physical Properties

Density: 3.26 g/cm³
Melting Point: 2200 °C

Material Characteristics

Work Hardening: No
Magnetic: No
Corrosion Resistance: moderate

General Preparation Notes

Aluminum nitride is a hard (1100-1200 HV), brittle non-oxide ceramic with exceptional thermal conductivity (170-230 W/mK) and a density of 3.26 g/cm³. The high thermal conductivity is governed by grain boundary phase composition; yttrium aluminate grain boundary phases scatter phonons less than oxygen-containing secondary phases. AlN reacts with water to form aluminum hydroxide and release ammonia, so non-aqueous preparation methods are preferred. Grain size, grain boundary phase distribution, and porosity are the features of interest.

Sectioning

Use a precision wafering saw with a diamond blade (0.15-0.3 mm). Cutting speed: 100-200 RPM with low feed rate. Use oil-based or non-aqueous coolant if available to prevent hydrolysis of the AlN surface. If water-based coolant is used, dry the sample immediately after cutting. The hard, brittle ceramic requires gentle cutting to prevent fracture and chipping. Leave 1-2 mm allowance for grinding.

Mounting

Cold mounting with castable epoxy is required. Use a low-viscosity, low-shrinkage epoxy resin. Vacuum impregnation is recommended for substrates with any porosity. Compression mounting is not recommended; the brittleness and relatively low fracture toughness (~3 MPa√m) create a risk of cracking under pressure. Ensure the epoxy is fully cured before grinding.

Grinding

The high hardness (1100-1200 HV) requires bonded diamond grinding discs. SiC paper wears too rapidly and produces poor surface quality on hard non-oxide ceramics. Use non-aqueous or oil-based lubricant to prevent hydrolysis. Disc speed: 200-300 RPM. Apply moderate pressure (20-30 N per 30 mm sample).

Grinding sequence:
  • 30μm diamond disc: Remove sectioning damage (30-90 seconds). Moderate pressure.
  • 15μm diamond disc: Refinement (30-60 seconds).
  • 9μm diamond disc: Final grinding (30-60 seconds). Reduce pressure to minimize subsurface cracking.
If water-based lubrication is used, minimize grinding time and dry the surface immediately after each step. Rotate specimen 90° between steps.
Recommended Sequence:
30μm diamond15μm diamond9μm diamond

Polishing

Use firm, napless cloths for all polishing steps. Use oil-based diamond suspensions rather than water-based to prevent hydrolysis. The hard ceramic requires longer polishing times than metals.

Diamond polishing sequence:
  • 6μm diamond: 3-5 minutes on a hard napless pad with moderate pressure (20-30 N per 30 mm sample). Oil-based suspension strongly preferred.
  • 3μm diamond: 3-5 minutes on a napless pad (20-25 N). Oil-based suspension.
  • 1μm diamond: 2-4 minutes on a napless pad (15-20 N).
Final polishing:
  • 0.05μm colloidal silica: 3-5 minutes on a soft pad with light pressure (12-18 N). Colloidal silica is water-based; minimize exposure time and dry immediately afterward. Alternatively, use 0.05μm diamond suspension on a soft pad for a fully non-aqueous final polishing step. Vibratory polishing (4-8 hours) produces the best results for grain boundary analysis.
Recommended Sequence:
6μm diamond3μm diamond1μm diamond0.05μm colloidal silica

Etching

AlN grain boundaries are revealed by thermal etching or aggressive chemical etchants. Thermal etching is preferred when the equipment is available.

Thermal Etching - Primary method:
  • Conditions: Heat polished sample to 1700-1900°C in nitrogen atmosphere for 15-30 minutes. An inert or nitrogen atmosphere is essential to prevent oxidation of AlN to Al₂O₃.
  • Reveals: Grain boundaries by thermal grooving. Also reveals the grain boundary phase (yttrium aluminate) distribution.
  • Note: The very high temperature requires a high-temperature furnace with controlled atmosphere.
Molten NaOH (Chemical Etching) - Alternative:
  • Composition: Molten NaOH at 300-400°C
  • Application: Immerse polished sample in molten NaOH for 30-120 seconds. AlN dissolves selectively at grain boundaries.
  • Reveals: Grain boundaries and grain boundary phase distribution.
  • Safety: Molten NaOH is extremely corrosive. Use nickel or stainless steel crucible. Full face shield, heat-resistant gloves, and protective clothing required. Work in fume hood.
Common Etchants:
Thermal Etching 1700-1900C in N2Molten NaOH

Heat Treatment

Sintered during manufacturing

No standards information available.

Applications

  • Power electronic substrates
  • LED packages
  • Heat sinks
  • RF module substrates

Typical Uses

  • IGBT module substrates
  • High-power LED submounts
  • Microelectronic heat spreaders
  • High-frequency circuit substrates